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第二届世界状态监测大会(WCCM 2019)通知
发布时间:2019-03-01


       由国际状态监测学会(ISCM)和新加坡无损检测学会(NDTSS)主办的第二届世界状态监测大会(WCCM 2019)将于2019年12月2日-5日在新加坡滨海湾金沙会展中心举行。大会将与新加坡国际无损检测大会暨展览会(SINCE2019)同期举行。


       世界状态监测大会(WCCM)是状态监测领域最大型的国际会议,本届会议的主题是状态监测的数字化,设立了状态监测方法和技术、仪器设备、信号处理、认证教育和培训、无损检测方法和技术、结构健康监测、损伤、故障和失效等多个专题,旨在推动状态监测领域新技术的交流与发展。


       中国无损检测学会和中国特种设备检测研究院将共同承办2021年在北京召开的第三届世界状态监测大会(WCCM2021),由沈功田主任委员担任大会主席。


       欢迎广大国内专家、学者关注并积极参加世界状态监测大会,促进我国状态监测技术不断进步。


       会议详细信息请浏览会议网站wccm2019.org



WELCOME TO WCCM 2019


Following the successful inaugural World Congress on Condition Monitoring (WCCM) 2017 in London, the International Society for Condition Monitoring (ISCM) and the Non-Destructive Testing Society Singapore (NDTSS) are proud to invite you to the 2nd World Congress at the Marina Bay Sands in Singapore from 2nd to 5th December 2019. The congress will be held in conjunction with the Singapore International NDT Conference and Exhibition (SINCE2019). This will create one of the largest combined events within the region, which will see communities and societies from both condition monitoring and NDT converge at a single venue to exchange ideas and network at an international level. As Singapore is an industrial hub, the event will also include participation from many major sectors including aerospace, civil, oil and gas, marine, railway, and manufacturing industries.


The theme of the event will focus on digitalisation with the advent of the fourth industrial revolution (Industry 4.0) and the Internet-Of-Things (IOT), which are expected to give significant improvements in productivity and asset value. The digital transformation also triggers opportunities and technologies in new and growing fields including data analytics, artificial intelligence, automation and robotics. Advancements in digital technologies for the industry like augmented reality (AR) and virtual reality (VR) will also see valuable changes and developments in education and training delivery for qualification and certification.


The congress cordially invites papers from academics, practitioners, and innovators who have views, engagements and breakthroughs to share in the area of digitalisation for condition monitoring. Submissions from all other relevant areas of condition monitoring including but not limited to the following are also welcomed:


Provisional Session Titles and Extended Topic List


CM Methods and Technologies

  • Equipment trouble shooting

  • Methods for fault severity estimation

  • Future directions for CM

  • CM methods and technologies

  • Condition monitoring via machinery performance parameters

  • Stress/Strain analysis

  • CM: Case Studies

 

Instrumentation and ITC for CM

  •  Wireless techniques and systems for CM

  • Architecture of CM systems

  • ITC for CM

  • CM systems

  • Hardware and software platforms for CM systems

  • High performance computing for CM systems

  • Robotics for CM

  • Off board and off board CM systems

  • OSA-CBM for CM

  • Integrated condition monitoring technologies and systems

  • Communication for CM

  • Internet of things and services for CM

  • Data storage and backup for CM

 

Certification, Education and Training for CM

  • Engineering standards for CM

  • CM education including CPD

  • CM training

  • CM certification

 

Asset Management

  • Asset management systems

  • Asset management via CM

  • Optimal asset replacement

  • Asset databases

  • Improvement of asset safety via CM

 

NDT Methods and Technologies 

  • NDT methods and technologies

  • Fusion of CM/NDT methods and technologies

  • NDT: Case Studies


Signal and Image Processing, Pattern Recognition, Finite Element Modelling and Simulation for CM 

  • Decision support for CM

  • Data mining and fusion

  • Optimisation in CM

  • Linear, non-linear, time, frequency and time-frequency signal processing techniques for CM

  • Signal processing techniques for non-stationary conditions

  • On-line and off-line adaptations of CM technologies

  • Feature extraction and pattern recognition for CM

  • Linear and non-linear finite element modelling for CM

  • Computational Fluid Dynamics

  • Linear and non-linear multi-freedom dynamical analysis of complex systems for CM

  • Modal analysis for CM

  • Simulation of linear and non-linear complex systems for CM

  • Computational methods for CM

  • Probabilistic and statistical methods for CM

 

Sensors and Actuators 

  • Standard sensors and actuators

  • New and advanced intelligent sensors and actuators

  • Embedded sensors and embedded calculations in sensors and actuators

  • Sensor fusion

  • Energy harvesting

 

Root Cause Analysis of Faults/Failures 

  • Fault free analysis

  • Root cause analysis: Ishikawa Diagram, 5 Whys, Eight Discipline Problem Solving, Scatter Diagrams, Is-Is not, etc.

  • Human and latent root causes of faults/failures

  • Root Cause Analysis: Case Studies

 

Structural Health Monitoring Maintenance


  • Maintenance planning, scheduling and control

  • Repair, replacement and overhaul

  • Management of enterprise shutdown and overhauls

  • Life-cycle cost benefit analysis for maintenance and CM

  • Failure effects and consequences

  • Through-life support

  • Risk assessment and management

  • Risk-based maintenance

  • Reliability centred maintenance and reliability improvement

  • Classical and advanced software for maintenance: CMMS, RCM++, ERP, etc.

  • Human errors in maintenance

  • Maintenance: Case Studies

 

Prognostics for CM 

  • Model driven prognostics

  • Data driven prognostics

  • Fatigue and fracture prognostics

  • Models for fault propagation

  • Condition indicators for prognostics

  • Prognostics: Case Studies

 

Materials 

  • Materials manufacturing

  • Materials characterisation

 

Damage, Fault and Failure 

  • Failure assessment methods

  • Physics of failure, fault/failure modes

  • Fatigue and fracture

 

Design and Manufacturing for CM and Maintenance        

  • Materials manufacturing

  • Design and life-cycle integrity

  • Design for optimal maintainability

  • Design improvement via CM

  • Simulation models and software for optimal asset design and manufacturing

 

Nano-Technologies for CM


The scientific programme will feature keynote presentations from an invited panel of internationally-renowned experts and thought leaders representing the condition monitoring world geographically and technologically.


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